VTS Thermal Shock Chamber Options

Listed below are the options that are available on VTS-Series thermal shock chambers.

Cabinet Options
Traveling Cable Ports Larger cable ports available in place of standard size port for ease of cable routing
Viewing Window Window available in upper chamber to view product under test. Window is standard on VTS-9 model.
Stainless Steel Basket Additional or spare product baskets with support rails are available and may be sized to your specifications.
Selector switches available for upstream/downstream air flow option to meet various test standard requirements.

Performance & Refrigeration Options
LN2 Boost Option Boost cooling is available for applications that require a fast pulldown rate. An LN2 supply tank is required with a pressure of 25 psi (172 kpa).
Dry Air Purge A dry air purge system can be provided to reduce condensation within the chamber and on the test item during temperature cycling testing. This option is primarily used to prevent short circuits in electronic components and is also used for low humidity requirements.

Instrumentation Options
EZ-View Chamber Software CSZ EZ-View software is available for monitoring and controlling up to 20 chambers from any location.
Chamber Hi-Low Limit Provides essential failsafe over/under (hi/low) temperature protection for your valuable test items.
IEEE Interface A parallel interface can be provided for interface with IEEE-488 parallel instrument control buss. A standard IEEE-488 connector is provided for easy connection to adjacent test equipment. This option is cannot be used in conjunction with RS-232/RS-485 communications.
Chart Recorder A selection of one or two pen chart recorders are available with a variety of pre-printed charts or self printing thermal charts.
Run Time Meter The optional run time meter includes a non-resettable display which will accumulate the system running time for routine maintenance and planning purposes.
Main Power Disconnect Provides an additional level of safety by shutting down the main power to the chamber prior to maintenance or repair.
Customer Event Option Includes 15 event outputs with connection panel & removable plug connectors. Designed to turn customer’s electronic DUT’s (devices under test) ON or OFF at various stages of the customer programmed test profile. Each output may also be configured to perform other operations including alarm or profile status indicators.
Digital Input Option Includes connection panel and 8 inputs that can be configured to perform various controller functions (i.e. start, hold, resume or terminate a profile, advance steps, control customer event outputs, etc.)

(provides 8 thermocouple / TC inputs through EZT-570i)

EZT Monitor Option Designed to consist of eight (8) “T” type thermocouples (TC’s) for temperature readout with individual alarms, displays, and data logging for each input that can be monitored by the EZT-570i and the EZ-View software. The “black-box” unit itself will be mounted to the side or rear of the unit and the eight TC’s will pass through one of the existing side ports. These are TC’s only (no RH sensors or PT100-RTD’s) and are used for product temperature monitoring or temperature uniformity check within the chamber. (For monitoring only, no control.)
Watlow F4 Controller CSZ F4 Programmable Controller with Product Monitor, redundant high/low limit and EIA 232/485 Computer Interface. Replaces EZT-570i and mounts on a special fixture below the door.