Accelerated Stress Test Chamber
In today’s fast moving and competitive environment,
there is an increasing need to quickly test products in order
to accelerate market introduction and improve product reliability
at a competitive price.
 CSZ’s
accelerated stress test chambers combine mechanical refrigeration;
LN2 cooling and high velocity air flow for fast product temperature
change rates. These chambers are typically designed to cycle
between 70°C to -20°C at a rate up to 30°C per
minute based upon the part temperature. These chambers are
commonly used for production stress testing circuit boards,
electronic drives, assemblies, etc. Design allows the user
to quickly control and change the temperature of the product
while the device is powered up. For ease of use and storage,
the chambers are equipped with a movable loading ramp allowing
the user to easily roll in their test rack and store the ramp
under the cart rack when not in use.
A variety of ports and fixtures are available as options
to accommodate different user interfaces and powering of devices.
Temperature Range: -20°C to 70°C
Other temperature ranges are available
Special Features:
- Workspace Volume: customized to requirements and number
of racks
- Fog-free window in the door
- Door interlock safety switch
- Dry Air Purge
- Pressure compensation during ramp
- Cycle indicator light
- Serial communications
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